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Browse by all authors  Browse By Author Name - Fahey, A: (2 results found) Subscribe to the RSS feed for this list or search Show the copy-friendly citations only display for this list or search Order By
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Roberson, Sonya, Sehgal, Amit, Fahey, A. and Karim, Alamgir (2003). Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Biosurfaces. Applied Surface Science 203-204 (). .    
Roberson, Sonya, Fahey, Albert, Sehgal, Amit and Karim, Alamgir (2002). Multifunction ToF-SIMS: combinatorial mapping of gradient energy substrates. Applied Surface Science 200 (). .    
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