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- June 19, 2013
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Browse By Author Name - Fahey, A:
(2 results found)
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Roberson, Sonya
,
Sehgal, Amit
,
Fahey, A.
and
Karim, Alamgir
(
2003
).
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Biosurfaces
.
Applied Surface Science
203-204
(). .
Roberson, Sonya
,
Fahey, Albert
,
Sehgal, Amit
and
Karim, Alamgir
(
2002
).
Multifunction ToF-SIMS: combinatorial mapping of gradient energy substrates
.
Applied Surface Science
200
(). .
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