http://matdl.org/repository/ Materials Digital Library en Fez 1.3 http://blogs.law.harvard.edu/tech/rss http://matdl.org/repository/view/matdl:1168 Our group studies the growth of organic semiconductor thin films, to better understand the connection between thin film morphology, crystal structure, and electronic device properties. Conventionally, thin films of organic semiconductors are deposited using thermal evaporation. However, the use of supersonic molecular beams to deposit thin films allows the incident kinetic energy of the organic semiconductor to be tuned in the range of 4-16 eV. The organic semiconductor thin films are characterized using in situ real time synchrotron x-ray scattering, and ex situ atomic force microscopy (AFM). My research experience this summer primarily consisted of analyzing x-ray data and studying the morphology of the thin films deposited on various dielectrics (self-assembled monolayers, SAMs) of varying chain length using AFM. Fri, 15 Apr 2011 14:42:09 Greer, Douglas